Bump for info regarding this 0.2ms RCD trip test
BS7671:2008 reduces the standard disconnection time from 0.4s to 0.2s for TT systems, a note under the table says that these times relate to residual fault currents significantly higher than the rated residual operating current of the device. (edit: and specify 2x rated residual opperating current as the figure they have in mind)
The natural conconclusion to be drawn is that RCDs should be tested at 2x to ensure they operate faster than 200ms, until we get the new GN3 we can't be 100%, but I'd say if you tested at 1x and 5x and the result was sub 0.2 for both, then there is no reason a 2x reading would not also be sub 200ms, I heard a rumour that the first admendment might change things in this area as well, so its a case of holding on and seeing
The way the standard times are applied has now changed, the standard time is for all final circuits of 32A or less, with the exception (5s on TN, 1s on TT) applying to distribution circuits and other circuits not cominging within the scope of the standard table (so that would be final circuits in excess of 32A)