I've had RCBOs explode on pressing the test button.
As I asked sparkticus, any thoughts about the mechanism of that?I've had RCBOs explode on pressing the test button.
As I'm sure you realised, I was thinking more about undoing and re-doing terminations, flexing cables, removing and replacing accessories from back boxes etc. etc., as well, of course, as problems created by carelessness during testing (killing things with IR tests, forgetting to reconnect cables/bonding/whatever etc.etc.)
- but what you say is interesting.
I'm actually surprised that RCDs can be killed by 'standard testing'. In my (very limited) experience, I haven't seen that happen. Any idea of the mechanism?
Just consider yourself lucky that you are not expected to test MCBs!
It's always refreshing and reassuring to see/hear confirmation that we're all human! I, too, am human, but am probably best advised to keep quite about how I have proved that in relation to matters electricalOh absolutely I agree (I was just drawn to my RCD testing fear) I have had a couple of call backs regarding faults that I have introduced during a PIR!! I forgot to reconnect a live that I had taken out of an MCB and I unwittingly destroyed a control panel back illumination LED with a 500 volt IR test.
Oh, you sound pretty innocent, then. I don't think that's murder - it's stumbling across a corpse!Well, in all cases it was on the first test (the first test that I had performed on that particular RCD) so I suspect it was not the testing but that the RCD had failed sometime before the test but of course I then have to take some remedial action which can be a pain at times when you just want to get the PIR done.
Indeed! Seriously, though, it's conceptually a bit strange that there isn't a requirement to test, particularly in situations in which one is reliant on the MCB for L-E fault protection. I guess it's just the (im)practicalities that have spared you that.Yes a water cooled test instrument would need to be developedJust consider yourself lucky that you are not expected to test MCBs!
I've had RCBOs explode on pressing the test button.
Same question for you, then - any thoughts about mechanism?Yay! I had an old Square D one do that...I sh@t me sen.....I've had RCBOs explode on pressing the test button.
I'm actually surprised that RCDs can be killed by 'standard testing'. In my (very limited) experience, I haven't seen that happen. Any idea of the mechanism?.
That's frightening - but we've obiously slid away from the matter of killing RCDs/RCBOs by testing them, since you are clearly talking about a dangerously malfunctioing unit here.The April edition of the Professional Electrician shows a picture of an RCBO that "blew up" when the test button was pressed. Interestingly the picture shows virtually no damage to the ARC chamber but the contact/coil area is devastated. I guess it's is possible that the ARC chamber was not damaged because it did what it is designed to do? (I don't know) The electrician who sent the picture in comments: "On doing so it immediately blew up in my face burning my thumb and the hairs off my hand. If I had not been wearing glasses things could have been a lot worse as the flames hit them full on"
All good theoretical points, but I find it very hard to believe that 'standard testing', per se, could possibly invoke any of those scenarios.The "common" RCD would need a very large un-balance in the order of many tens of amps before there could be enough energy in the sensor's output to damage the solenoid coil that releases the switch to the OFF position. It might be that a large DC un-balance could leave the sensor's magnetic core ( of the current transformer ) permanently magnetised and that would then affect its operation. The "intelligent" RCDs that have electronic circuitry would be far more prone to damage from voltage spikes on the mains.I'm actually surprised that RCDs can be killed by 'standard testing'. In my (very limited) experience, I haven't seen that happen. Any idea of the mechanism?.
Maybe I'm wrong, but I still find it hard to believe that testing, per se, can do any harm to these devices, since the testing is (I presume) doing no more than emulating a (I guess fairly modest) fault situation.
Exactly, and if any of that could cause an RCD to fail (let alone 'explode'), they would surely be dangerously unfit for purpose.No I don't think you are wrong. An RCD test instrument (especially a calibrated one) should, within tolerances, initiate only fault currents of 15mA, 30mA and 150mA (assuming a 30mA RCD). I don't know what the integral RCD test button initiates in terms of test current but I can't imagine it is more than 150mA and quite possibly 30mA.
Exactly, and if any of that could cause an RCD to fail (let alone 'explode'), they would surely be dangerously unfit for purpose.
You quite often talk of your concerns about the reliability of RCDs but, as I hinted at recently, what about MCBs - might they not be at least as unreliable? For what are presumably just practical reasons, we don't test them routinely, and nor are they regularly 'exercised' by a test button (failure to do which is said to be a reason for RCD malfunction).
I suppose that the problem for the manufacturers of MCBs (and the Standards) are that I don't think there is any way of undertaking realistic accellerated long-term reliability tests. In other words, if one wants to determine whether MCBs still operate reliably after 20+ years of never operating, one has to set up the experiment an then wait 20+ years for the answer.
Maybe 'unsubstantiated', but your first one is compelling. There is no way that the normal test current (via test button or a tester) could cause an explosion. As you say, only a L-N 'event' within the device could really bring that about.Though (I am happy to report) I have not seen an exploding RCBO myself, I have heard of several (probably 6 - 7) including the two mentioned in this thread. My fear re these exploding RCBOs is that it is not the test current but a short between live and neutral! I have two completely unsubstantiated reasons for saying that...
Exactly.Yes, I tend to agree. In fact, on one hand because of the substantially higher currents (and of course variable currents depending upon rating) required to test disconnection of an MCB, the test may even lead to more failures and/or discovery of more failed devices than that offered by the RCD/RCBO world.
I suspect you mean I1 and I2 - since In is really just part of the specification, not something that can be measured. I, too, have done some bench tests in the distant past, using ELV and, like you, satisfied myself that the published I2 figures seem about right.Now of course I am not in anyway suggesting or advocating field testing of MCBs, that would be far too exciting!! Though I have done some "home testing" of my own and came up with variable results. What I did conclude on a 6 amp and 20 amp MCB (quite some time ago) was that they pretty much perform to the published curves for In and I2.
Quite so. In some situations, accelerated testing using extremes of environmental conditions (and/or cycling thereof) can be of value - but in the context we're talking about, the interest is in how an MCB performs after 20+ years of 'doing nothing' under normal environmental conditions - and there really is no way of accelerating that. The big problem that creates in this world of fairly rapidly evolving technology is that we often don't have hard long-term reliability data until after a type of product has become obsolete!Exactly, I'm sure simulations and accelerated testing are done but as I learned from past semiconductor test experience, you can't get 20 years of experience in anything less than 20 years.
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